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Ion Milling System ArBlade 5000 : Hitachi High-Tech Corporation
Web1 sep. 2000 · The technology for the compensation and neutralization of ion beams with low-energy electrons may benefit from a large range of available electron guns. The industrial production of electron source devices featuring the characteristic intensities, energies, and time structures suitable for ion beam neutralization is well advanced today. A secondary ion mass spectrometer consists of (1) a primary ion gun generating the primary ion beam, (2) a primary ion column, accelerating and focusing the beam onto the sample (and in some devices an opportunity to separate the primary ion species by Wien filter or to pulse the beam), (3) high vacuum sample chamber holding the sample and the secondary ion extraction lens, (4) a mas… tsu liability insurance
Neutralization principles for the extraction and transport of ion beams ...
WebAn Ion Gun typically refers to an instrument that generates a beam of heavy ions with a well defined energy distribution. The ion beam is produced from a plasma that has been confined within a volume. Ions of a particular energy are extracted, accelerated, collimated and/or focused. The ion gun is composed of an ion source, extraction grid structure and … WebThe sources provide an extremely reliable and maintenance-free up to 3kW source for many applications in PVD processes. The compact design and rugged construction allows easy installation to both new and existing vacuum deposition systems. Full-time use of high purity oxygen, argon or nitrogen. Extremely low maintenance. WebPatented dual beam source; Single mode flood gun for all sample types; Single mode for all X-ray spot sizes; Ultra-low energy beam results in minimal shift from reference positions; … tsumasho_tbs